Imagine Optic’s HASO3 128 GE2 wavefront sensors offers professionals unsurpassed quality, precision and ease of use. Key features include:
• Working wavelength range between 400 and 1100 nm
• highest-resolution - 16,384 independent measurement points
• Largest aperture dimension of 14.6 x 14.6 mm²
• simultaneous and independent measurement of both phase & intensity
• true absolute measurement
• unbeatable accuracy and dynamic range
• temperature stabilized for long term measurements
Exceptional results come from accurate measurement. We conceive, build and support our products to meet and exceed our customers’ needs. For over 10 years, Imagine Optic’s wavefront sensors have become an industry standard for reliability and durability. Their independent yet simultaneous measurements of both phase and intensity are key in consistently providing customers with the high-quality wavefront metrology results they can depend on.
HASO3 128 GE2 is based on our patented Shack-Hartmann technology. Fast, performing and easy to integrate, their insensitivity to vibration and compact design make them the ideal choice for demanding industrial and scientific applications.
In laser and optical metrology, your HASO3 128 GE2 wavefront sensor used with HASOv3 software enables you to:
• conduct zonal and modal wavefront reconstruction
• visualize the spot diagram and raw camera data
• calculate the PSF*, MTF* and Strehl ratio*
• obtain the M²* parameter
For adaptive optics, HASO3 WFS coupled with our CASAO™ software, lets you:
• perform precision metrology to control your active components including deformable mirrors and SLM
• perfect your beam’s shape and optimize its focal spot
| Description | Specification |
|---|---|
| Aperture dimension | 14.6 x 14.6 mm² |
| Number of microlenses | 128 x 128 |
| Tilt dynamic range | >±3° (1500 λ) |
| Focus dynamic range - minimum local radius of curvature | 15 mm |
| Focus dynamic range - maximum NA | > 0.1 |
| Repeatability (rms) | < λ/200 |
| Wavefront measurement accuracy in relative mode (rms)1 | ~λ/150 |
| Wavefront measurement accuracy in absolute mode (rms)² | ~λ/100 |
| Tilt measurement sensitivity (rms) | <1 µrad |
| Focus measurement sensitivity (rms) | 2.5·10-4 m-1 |
| Spatial resolution | ~110 µm |
| Maximum acquisition frequency (sequential acquisition) | 7.5 Hz |
| Processing frequency (CPU 3Ghz, 512 Mb RAM) | 5.0 Hz |
| Working wavelength range | 350 - 1100 nm |
| Calibrated wavelength range | A (400 - 600 nm), B (500 - 700 nm), C (630 - 900 nm), D (800 - 1100 nm) |
| Extended wavelength range* | A+ (400 - 700 nm), B+ (500 - 900 nm), C+ (630 - 1100 nm) |
| Dimensions / weight | 115 x 51 x 60 mm / 400 g |
| Working temperature | 15 - 30° C |
| Interface / Power supply | Giga Ethernet / 12 V / 6 W |
| Operating system | Win 7 (x86 / x64) |
| HASOv3 metrology software | included |
| External trigger | yes |
(1) Wavefront as seen by the device. (2) Difference between the real wavefront and a reference wavefront obtained in similar conditions (5λ of shift max). * sold separately | |
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