Ondax’s patented1 SureBlock™ XLF Notch Filter Systems enable fast, clear capture of Raman spectra in the Low-Frequency (Low Wavenumber/THz regime (~5 cm-1 to 200 cm-1, or 150 GHz to 6 THz), using only a standard single-stage spectrometer. THz-Raman is powerful new technique for molecular and intermolecular structural analysis that is both simple and compact when compared to multi-stage or THz spectrometers, and represents a dramatic shift in the economics, efficiency, and ease of use of Raman spectroscopy.
The unique ultra-narrow band design of our patented SureBlock™ Notch Filters also delivers exceptionally high throughput of both Stokes and anti-Stokes shifts up to >5000cm-1 (>150 THz). This allows observation of low-frequency vibrational/phonon modes, differentiation of polymorphs and other structural characteristics of pharmaceuticals, nano- and bio-materials; trace detection and forensics analysis of explosives and chemical/biological threat agents; and characterization of industrial, polymers, petroleum, heavy metals, and geological samples.
The XLF is an integrated, pre-aligned, light-tight, double-notch system with selectable fiber- or free-space input and outputs, adaptable for use with any single-stage spectrometer. All XLF systems provide > OD 8 Rayleigh suppression, and are engineered for fast, flexible integration with a wide variety of existing commercial spectrometers microscopes, and Raman systems. Available at standard Raman wavelengths including: 488nm, 514nm, 532nm, 633nm, and 785nm, and 830nm, these compact, robust plug-and-play systems deliver incredible speed, resolution and ease of use, all at an extremely affordable price!
Polymorphic structure identification
Structural studies of nano-and bio-materials
Trace detection and source attribution of explosives/hazmat/drugs
Forensics studies
Geological specimen analysis and gemology
Fast collection of ultra-low-frequencey/THz-Raman spectra
High Optical Density (.OD8) with extremely high thoughput*
Ultra-compact footprint, plug-and-play operation, configurable input & output ports (free space or fiber coupled)
Compatible with most commercial spectrometers, microscopes and Raman systems
Available at 488, 514, 532, 633, 785 and 830nm. Custom wavelengths by request
*Throughput varies with wavelength
*Throughput varies with wavelength
SpecificationsTechnical DataMechanical DrawingsOrdering Information
| Parameter | 488nm | 514nm | 532nm | 633nm | 78Xnm |
|---|---|---|---|---|---|
| Spectral Transition Width (center to 50% transmission) | <10cm-1 | <10cm-1 | <10cm-1 | <10cm-1 | <10cm-1 |
| Optical Density at Laser Line (each filter) | >4 | >4 | >4 | >4 | >4 |
| Expected System Optical Density | >8 | >8 | >8 | >8 | >8 |
| Free Space Aperture Diameter | Standard: 9mm, Custom sizes available | ||||
| Fiber Input/Output Connector Type | Recommended: FC/PC, Others available upon request | ||||
1Data taken using an Ondax SureLock™ 785nm wavelength stabilized laser, SureBlock™ 785nm ultra narrow-band notch filter, and a single-stage Princeton Instruments SpectraPro 2300i
All dimensions in mm
All dimensions in mm
†Output via multimode fiber is recommended
*Throughput varies with wavelength
