这种“集多功能于一身”的校准卡可用来校准显微镜和机器视觉系统的参数，而不需分别校正。本卡可用来测试和校准Mitutoyo物 镜，Zeiss物镜，以及高倍视频镜头的分辨率，畸变，以及景深(DOF)等等。测试卡中包括各种频率的蚀刻线，一组栅格和同心圆，一组微刻尺，以及边缘撑块来支撑 测量景深的卡。带使用信息卡， 一盘CD（操作说明），以及NIST认证说明。
低频测试板用在倍率为4X到20X的物镜，适合用在机器视觉系统上的低倍长焦系统
高频测试板用在倍率为20X到100X的物镜，可用在显微镜和其它高倍短焦系统。
| 4X - 20X Target Specifications - Concentric Circles | ||
| Outer Diameter (mm) | Line Spacing (mm) | Line Width (μm) |
| 5.0 | 0.25 | 20 |
| 4.0 | 0.25 | 15 |
| 3.0 | 0.25 | 10 |
| 2.0 | 0.10 | 7.5 |
| 1.0 | 0.10 | 5 |
| ||
| 4X - 20X Target Specifications - Grids | ||
| Width (mm) | Line Spacing (mm) | Line Width (μm) |
| 4.5 | 0.25 | 20 |
| 4.5 | 0.25 | 15 |
| 4.5 | 0.25 | 10 |
| 4.5 | 0.10 | 15 |
| 4.5 | 0.10 | 10 |
| 4.5 | 0.10 | 5 |
| 2.55 | 0.075 | 10 |
| 2.55 | 0.075 | 5 |
| 2.55 | 0.050 | 5 |
| 2.55 | 0.050 | 2.5 |
| ||
| 4X - 20X Target Specifications - Ronchi Rulings | ||
| Range (lp/mm) | Frequency Change (lp/mm) | |
| 60 - 380 | 20 | |
| 4X - 20X Target Specifications - Linear Microscale | ||
| Length (mm) | Divisions/mm | Microns/divisions |
| 0 - 68.2 | 20 | 50 |
| 20X - 100X Target Specifications - Concentric Circles | ||
| Outer Diameter (mm) | Line Spacing (mm) | Line Width (μm) |
| 3.0 | 0.25 | 10 |
| 2.0 | 0.10 | 7.5 |
| 1.5 | 0.10 | 5 |
| 1.0 | 0.05 | 5 |
| 1.0 | 0.05 | 2.5 |
| ||
| 20X - 100X Target Specifications - Grids | ||
| Width (mm) | Line Spacing (mm) | Line Width (μm) |
| 3.0 | 0.25 | 10 |
| 3.0 | 0.25 | 7.5 |
| 3.0 | 0.25 | 5 |
| 3.0 | 0.10 | 10 |
| 3.0 | 0.10 | 7.5 |
| 3.0 | 0.10 | 5 |
| 2.55 | 0.075 | 10 |
| 2.55 | 0.075 | 5 |
| 2.55 | 0.050 | 5 |
| 2.55 | 0.050 | 2.5 |
| ||
| 20X - 100X Target Specifications - Ronchi Rulings | ||
| Range (lp/mm) | Frequency Change (lp/mm) | |
| 240 - 600 | 10 | |
| 20X - 100X Target Specifications - Linear Microscale | ||
| Length (mm) | Divisions/mm | Microns/divisions |
| 0 - 68.2 | 20 | 50 |
尺寸（英寸）:
1 x 3
整体精度 (μm):
±1.0
平行度（弧分）:
1.00
表面平整度:
3 - 4λ
涂层:
Evaporated Chrome Pattern
基底:
