Speed up alignment for quick & easy beam collimation testing
Useable in the UV, VIS, and NIR wavelengths
50.8mm diameter with 80% clear aperture
Surface flatness ≤ Λ/10 at 633 nm
The Shear Plate Collimation Tester allows quick and easy beam collimation, significantly speeding up the process of aligning optical setups. UV Fused Silica substrate material enables use across a wide 195 to 2100 nm wavelength range.
Model | Description | Availability | Price | Qty. | |
---|---|---|---|---|---|
20QS20 | Shear Plate Collimation Tester, 50.8 mm, UV Fused Silica | Call | ¥6,713.59 | ADD |
The edge of the optic is marked with an arrow indicating the thickest part of the optic. The arrow points toward the front surface of the optic, which should face the incident beam. For a horizontally propagating beam the mark should be positioned on top so that the wedge is perpendicular to the plane of incidence.
The edge of the optic is marked with an arrow indicating the thickest part of the optic. The arrow points toward the front surface of the optic, which should face the incident beam. For a horizontally propagating beam the mark should be positioned on top so that the wedge is perpendicular to the plane of incidence.
When horizontal beam is collimated, fringes will be horizontally oriented. Fringe orientation will be tilted slightly when beam is diverging or converging.
UV Grade Fused Silica is synthetic amorphous silicon dioxide of extremely high purity providing maximum transmission from 195 to 2100 nm. This non-crystalline, colorless silica glass combines a very low thermal expansion coefficient with good optical qualities, and excellent transmittance in the ultraviolet region. Transmission and homogeneity exceed those of crystalline quartz without the problems of orientation and temperature instability inherent in the crystalline form. It will not fluoresce under UV light and is resistant to radiation. For high-energy applications, the extreme purity of fused silica eliminates microscopic defect sites that could lead to laser damage.
Material | UV Grade Fused Silica |
Diameter | 50.8 mm |
Center Thickness (nominal) | 9.4 mm |
Chamfers (facewidth) | 0.38–1.14 mm |
Chamfers Angle/Tolerance | 45° ±15° |
Clear Aperture | Central 80% of diameter |
Surface Quality | 60-40 scratch-dig |
Surface Flatness | ≤λ/10 at 632.8 nm over the clear aperture |
Wedge Angle | 4.4 ± .88 arc sec arc sec (Approximate) |
Dimension (mm) | |||
Model | øA | øB | C (nominal center thickness) |
20QS20 | 2.00 (50.8) | 40.6 | 9.40 |